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美国爱荷华州立大学Degang Chen教授讲座

2018-08-13 10:01:14  发布人:孙雷

应哈工大电气学院乔立岩教授、俞洋副教授邀请,集成电路设计和测试领域国际知名学者、IEEE  Fellow、美国爱荷华州立大学Degang Chen教授将于2018814日来哈尔滨工业大学访问讲学。

讲学题目Cost Effective Techniques for Design, Testing, and Built-in Self-Calibration of Analog and Mixed-Signal Integrated Circuits

讲学时间2018814日上午930

讲学地点:科学园2A714会议室

Abstract:

As semiconductor technology advances into a new era of Internet of Things, increasingly more development emphasis is being placed on interface circuits and increasingly more analog and mixed-signal functions are deeply embedded in complex ICs. On one hand, customers and system integrators demand higher and higher circuit performance; on the other hand, low-cost pressure keeps shrinking the resources available for achieving such performance. Furthermore, many important applications such as automotive electronics pose stringent requirements on reliability and functional safety, pushing for sub 1 dppm (defective parts per million) designs. 

In this talk, we will describe some recent analog design techniques for cost-effective enhancement of analog and mixed-signal circuit performance. These will include performance enhancements for fundamental building blocks such as operational amplifiers and bandage references. Ultra small and high linearity techniques will also be shown for designing integrated sensors such as temperature sensors and current sensors which are critical for power, thermal and reliability management. High speed and/or high precision design techniques for analog to digital converters and digital to analog converters will also be reviewed. To move towards the goal of sub 1 dppm analog circuits, analog verification techniques and analog fault coverage simulation techniques will be introduced that dramatically improved the accuracy and time efficiency as compared to state of the art techniques. To enable in-field monitoring of operation performance and operation safety, techniques and algorithms will be introduced for built-in self-test of analog and mixed-signal circuits. Test results from built-in self-test can then be utilized for built-in self-calibration and self-healing.

 

Short Bio:

Degang Chen received his BS degree in instrumentation and automation from Tsinghua University, China, in 1984 and his PhD degree in control theory from UC Santa Barbara, CA, USA, in 1992. 

He was the John R. Pierce Instructor at CalTech in 1992. After that, he joined Iowa State University where he is currently Professor of Electrical Engineering and the Jerry Junkins Chair in the College Engineering. His industry experience includes Beijing Institute of Control Engineering in 1984-1986, the Boeing Company in 1999 summer, Maxim Integrated in 2001 summer, and Texas Instruments in 2011, 2012 and 2014 summers. His current research interests are in analog and mixed-signal IC design and testing, integrated sensor design, analog verification, and built-in self-test self-calibration for enhancing performance and reliability.

Dr. Chen has authored and co-authored 8 patents and over 280 refereed publications in leading journals and top international conferences. Of those, 14 received best paper awards and other honors, including the prestigious IEEE Ned KornfieldBest Paper Award in 2013 and again in 2014. He has frequently delivered technical seminars at most leading semiconductor companies such as Texas Instruments, Intel, Broadcom, Qualcomm, IBM, Infineon, NVidia, Xilinx, etc., as well as at various universities.

Dr. Chen is a Fellow of the IEEE, and is an IEEE Instrumentation and Measurement Society Distinguished Lecture.